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Publications in Scientific Journals:

A. Shah, M. Waltl:
"Impact of Negative Bias Temperature Instability on Single Event Transients in Scaled Logic Circuits";
International Journal Of Numerical Modelling-Electronic Networks Devices And Fields, 34 (2021), 3; e2854-1 - e2854-13.



"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1002/jnm.2854

Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2021/JB2021_Waltl_1.pdf


Created from the Publication Database of the Vienna University of Technology.