Talks and Poster Presentations (with Proceedings-Entry):
A. Vasilev, M. Jech, A. Grill, G. Rzepa, C. Schleich, A. Makarov, G. Pobegen, T. Grasser, M. Waltl, S. E. Tyaginov:
"Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors";
Talk: IEEE International Integrated Reliability Workshop (IIRW),
South Lake Tahoe, CA, USA - virtual;
2020-10-04
- 2020-10-08; in: "Proceedings of the International Integrated Reliability Workshop (IIRW)",
(2020),
1
- 4.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IIRW49815.2020.9312864
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2020/CP2020_Vasilev_1.pdf
Created from the Publication Database of the Vienna University of Technology.