[Back]

G. Siroky, E. Kraker, J. Rosc, D. Kieslinger, R. Brunner, S. van der Zwaag, E. Kozeschnik, W. Ecker:
"Analysis of Sn-Bi Solders: X-ray Micro Computed Tomography Imaging and Microstructure Characterization in Relation to Properties and Liquid Phase Healing Potential";
Materials, 14 (2021), 1, 153; 1 - 22.

This work provides an analysis of X-ray micro computed tomography data of Sn-xBi solders with x = 20, 30, 35, 47, 58 wt.% Bi. The eutectic thickness, fraction of eutectic and primary phase are analyzed. Furthermore, the 3D data is evaluated by means of morphology parameters, such as, shape complexity, flatness, elongation and mean intercept length tensor. The investigated alloys are categorized in three groups based on their morphology, which are described as "complex dominant", "complex- equiaxed" and "mixed". The mechanical behavior of Sn-Bi alloys in the semi-solid configuration and the correlation with microstructural parameters are discussed. A varying degree of geometric anisotropy of the investigated alloys is found through the mean intercept length tensor. Representative volume element models for finite element simulations (RVE-FEM) are created from tomography data of each alloy to analyze a correlation of geometric and elastic anisotropy. The simulations reveal an elastic isotropic behavior due to the small difference of elastic constants of primary and eutectic phase. A discussion of properties in the semi-solid state and liquid phase healing is provided.

solder; X-ray; computed tomography; morphology; anisotropy; FEM; healing; semi-solid; elastic; RVE

http://dx.doi.org/10.3390/ma14010153