Publications in Scientific Journals:
H. Ceric, S. Selberherr, H. Zahedmanesh, R. Orio, K. Croes:
"Review - Modeling Methods for Analysis of Electromigration Degradation in Nano-Interconnects";
ECS Journal of Solid State Science and Technology,
10
(2021),
3;
035003-1
- 035003-11.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1149/2162-8777/abe7a9
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2021/JB2021_Ceric_1.pdf
Created from the Publication Database of the Vienna University of Technology.