Publications in Scientific Journals:
K. Tselios, D. Waldhör, B. Stampfer, J. Michl, E. Ioannidis, H. Enichlmair, T. Grasser, M. Waltl:
"On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors";
IEEE Transactions on Device and Materials Reliability (invited),
91
(2021),
2;
199
- 206.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TDMR.2021.3080983
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2021/JB2021_Tselios_1.pdf
Created from the Publication Database of the Vienna University of Technology.