Talks and Poster Presentations (with Proceedings-Entry):
S. Naz, A. Shah, S. Ahmed, G. Patrick, M. Waltl:
"Design of Fault-Tolerant and Thermally Stable XOR Gate in Quantum dot Cellular Automata";
Poster: IEEE European Test Symposium (ETS),
Bruges, Belgium (Virtual);
2021-05-24
- 2021-05-28; in: "Proceedings of the IEEE European Test Symposium (ETS)",
(2021).
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/ETS50041.2021.9465459
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2021/CP2021_Naz_1.pdf
Created from the Publication Database of the Vienna University of Technology.