Publications in Scientific Journals:
D. Waldhör, C. Schleich, J. Michl, B. Stampfer, K. Tselios, E. Ioannidis, H. Enichlmair, M. Waltl, T. Grasser:
"Toward Automated Defect Extraction From Bias Temperature Instability Measurements";
IEEE Transactions on Electron Devices,
68
(2021),
8;
4057
- 4063.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TED.2021.3091966
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2021/JB2021_Waldhoer_1.pdf
Created from the Publication Database of the Vienna University of Technology.