Contributions to Books:
T. Hadámek, M. Bendra, S. Fiorentini, J. Ender, R. Orio, W. Goes, S. Selberherr, V. Sverdlov:
"Temperature Increase in MRAM at Writing: A Finite Element Approach";
in: "Proceedings of the 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)",
B. Cretu (ed.);
IEEE,
2021,
ISBN: 978-1-6654-3746-2,
1
- 4.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/EuroSOI-ULIS53016.2021.9560669
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2021/BC2021_Hadamek_1.pdf
Created from the Publication Database of the Vienna University of Technology.