Publications in Scientific Journals:
J. Michl, A. Grill, D. Waldhör, W. Goes, B. Kaczer, D. Linten, B. Parvais, B. Govoreanu, I. Radu, M. Waltl, T. Grasser:
"Efficient Modeling of Charge Trapping at Cryogenic Temperatures-Part I: Theory";
IEEE Transactions on Electron Devices,
68
(2021),
12;
6365
- 6371.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TED.2021.3116931
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2021/JB2021_Michl_2.pdf
Created from the Publication Database of the Vienna University of Technology.