Publications in Scientific Journals:
M. Waltl, D. Waldhör, K. Tselios, B. Stampfer, C. Schleich, G. Rzepa, H. Enichlmair, E. Ioannidis, R. Minixhofer, T. Grasser:
"Impact of Single-Defects on the Variability of CMOS Inverter Circuits";
Microelectronics Reliability,
126
(2021),
114275-1
- 114275-6.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2021.114275
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2021/JB2021_Waltl_4.pdf
Created from the Publication Database of the Vienna University of Technology.