[Zurück]

M. Neuhaus, J. Schötz, M. Aulich, A. Srivastava, D. Kimbaras, V. Smejkal, V. Pervak, M. Alharbi, A. Azzeer, F. Libisch, C. Lemell, J. Burgdörfer, Z. Wang, M. Kling:
"Transient field-resolved mid-infrared reflectometry at 50-100 THz";
Optica, 9 (2022), 1; S. 42 - 49.

Transient field-resolved spectroscopy enables studies of ultrafast dynamics in molecules, nanostructures, or solids with sub-cycle resolution, but previous work has so far concentrated on extracting the dielectric response at frequencies below 50 THz. Here, we implemented transient field-resolved reflectometry at 50-100 THz (3-6 μm) with MHz repetition rate employing 800 nm few-cycle excitation pulses that provide sub-10 fs temporal resolution. The capabilities of the technique are demonstrated in studies of ultrafast photorefractive changes in semiconductors Ge and GaAs, where the high frequency range permitted to explore the resonance-free Drude response. The extended frequency range in transient field-resolved spectroscopy can further enable studies with so far inaccessible transitions, including intramolecular vibrations in a large range of systems.

Transient reflectometry, THz spectroscopy

http://dx.doi.org/10.1364/OPTICA.440533