Contributions to Proceedings:

R. Prestros, K. Hollaus, B. Auinger, M. Leumüller:
"Benchmark for the Near-Field Problem: Simulation versus Measurement";
in: "2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE", 1; F. Maradei, M. Feliziani, M. Sarto (ed.); 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, IEEE, Danvers, MA, USA, 2021, ISBN: 978-1-7281-5579-1, Paper ID 20096561, 5 pages.

English abstract:
This paper evaluates how exactly impedances and the near field around a typical housing of an electronic based system with openings can be simulated. Two variants of the device under test (DUT) representing typical electronic device housings with balanced and unbalanced feeding were built and simulated. The 3D finite element simulation results showing the electric field strength and impedance plots are compared to near-field and impedance measurements. The results should give a feeling how exactly the shielding effect on the near field of an electronic housing can be simulated.

"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)

Created from the Publication Database of the Vienna University of Technology.