Talks and Poster Presentations (with Proceedings-Entry):
J. Ender, R. Orio, S. Fiorentini, S. Selberherr, W. Gös, V. Sverdlov:
"Improving Failure Rates in Pulsed SOT-MRAM Switching by Reinforcement Learning";
Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF),
Bordeaux, France;
2021-10-04
- 2021-10-07; in: "Proceedings of the 32nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis",
(2021),
ISSN: 0026-2714;
1
- 4.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2021.114231
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2021/CP2021_Ender_06.pdf
Created from the Publication Database of the Vienna University of Technology.