Talks and Poster Presentations (with Proceedings-Entry):
C. Wilhelmer, M. Jech, D. Waldhör, A.-M. El-Sayed, L. Cvitkovich, T. Grasser:
"Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network";
Talk: European Solid-State Device Research Conference (ESSDERC),
Grenoble, France;
2021-09-13
- 2021-09-22; in: "Proceedings of the European Solid-State Device Research Conference (ESSDERC)",
(2021),
ISBN: 978-1-6654-3748-6;
243
- 246.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/ESSDERC53440.2021.9631833
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2021/CP2021_Wilhelmer_01.pdf
Created from the Publication Database of the Vienna University of Technology.