Publications in Scientific Journals:
B. Ruch, G. Pobegen, T. Grasser:
"Localizing Hot-Carrier Degradation in Silicon Trench MOSFETs";
IEEE Transactions on Electron Devices,
68
(2021),
4;
1804
- 1809.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TED.2021.3060697
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2021/JB2021_Ruch_2.pdf
Created from the Publication Database of the Vienna University of Technology.