Publications in Scientific Journals:
M. Waltl, Y. Hernandez, C. Schleich, K. Waschneck, B. Stampfer, H. Reisinger, T. Grasser:
"Performance Analysis of 4H-SiC Pseudo-D CMOS Inverter Circuits Employing Physical Charge Trapping Models";
Materials Science Forum,
1062
(2022),
688
- 695.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.4028/p-pijkeu
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2022/JB2022_Waltl_2.pdf
Created from the Publication Database of the Vienna University of Technology.