Contributions to Books:
M. Waltl, Y. Hernandez, C. Schleich, K. Waschneck, B. Stampfer, H. Reisinger, T. Grasser:
"Performance Analysis of 4H-SiC Pseudo-D CMOS Inverter Circuits Employing Physical Charge Trapping Models";
in: "Silicon Carbide and Related Materials 2021",
J. Michaud, L. Phung, D. Alquier, D. Planson (ed.);
Trans Tech Publications Ltd , Switzerland,
2022,
ISBN: 9783035727609,
688
- 695.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1002/adma.202201082
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2022/BC2022_Waltl_1.pdf
Created from the Publication Database of the Vienna University of Technology.